This standalone integral software and hardware platform is capable of functioning as an independent single-channel or virtual multi-channel characterization test subsystem. The platform is USB controlled to provide temperature, RF-signal and bias-control to a device-under-test (DUT) for semiconductor performance measurement. When used in conjunction with Accel-RF’s embedded Pulser-Card Assembly, the test device is capable of pulsed DC and RF stimulus.
Testing at elevated temperature is precisely controlled and referenced to the base-plate or to the device channel or junction temperature if the device thermal-resistance is known. The Test Platform compatible with the Quantum SMART modular fixture. It is also compatible with Accel-RF’s AARTS LIFETEST product-line and may be used with standard test fixtures utilized in an AARTS reliability test system.