Accel-RF Instruments Corporation is the world-leader in supplying equipment for performing measured long-term reliability assessment on compound-semiconductors. To keep up with the shift in GaN from “research novelty” to “market reality”, Accel is expanding its RFBL measurement equipment with the introduction of an 80-Channel RF Bias Burn-In System.

The system architecture is derived from the highly developed and field-proven measurement platform product, AARTS. Accel-RF has supplied AARTS equipment to top-tier manufactures for over 12 years, and more recently, has supplied equipment to most of the contractors participating in the DARPA wide-band-gap (WBG) semiconductor initiative and the follow-on Title III Program.

Accel-RF’s platform solution is the only available integrated instrument that can demonstrate a compliance with aerospace, government, and commercial RF semiconductor life-test standards. Accel-RF’s customers receive maximum return-on-investment (ROI) through reduced development time, demonstrated reliability assessment, and increased“permission-to-play” market opportunities.

These systems deliver an unbeatable combination of advantages over a wide range of RF frequencies and power levels. The Automated Multi-Channel RF-Biased Burn-In Test System is a turnkey system that incorporates all of the capability needed for accelerated aging and parametric testing of RF semiconductor devices. Its powerful software elegantly supports data acquisition, storage, and presentation. Accel-RF’s customers choose system features to meet their technical needs and capital budget. In addition to cost savings, use of Accel-RF’s solutions accelerate product time-to-market, saving many months of product development.


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