Accel-RF Announces New RF-Biased Burn-In Test System

Accel-RF Instruments Corporation, the world-leader in supplying equipment for performing measured long-term reliability assessment on compound-semiconductors, announces the expansion of its RFBL measurement equipment with the introduction of an 80-Channel RF Bias Burn-In System.

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Accel-RF Announces CRADA with AFRL

SAN DIEGO–(BUSINESS WIRE)–Accel-RF Corporation announces the signing of a Cooperative Research and Development Agreement (CRADA) with the Aerospace Components and Subsystems Division of the Sensors Directorate of the Air Force Research Laboratory (AFRL/RYD) relating to compound semiconductor reliability measurement expansion…

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Smart Fixture Press Release

SAN DIEGO–(BUSINESS WIRE)–Accel-RF, the worldwide leader in turn-key RF Reliability and Performance Characterization Test Systems for Compound Semiconductors, announces the addition of a new ‘Smart Fixture’ product-line for performance characterization of compound semiconductor devices. This USB controlled fixture, complete with..

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Accel-RF Announces Shipments to Europe

SAN DIEGO–(BUSINESS WIRE)–Accel-RF Corporation, the world leader in turn-key RF Reliability Testing Systems for Compound Semiconductor devices, today announced the successful shipment and installation of five advanced high power reliability test systems to customers in Europe, in Q4 of 2009…

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