AARTS provides automated accelerated life-test systems specifically designed for performing elevated temperature life-testing of advanced compound semiconductor devices. This system measures, characterizes, and records performance degradation and failure levels of RF devices in order to demonstrate and predict mean-time-to-failure (MTTF) and (FIT) probabilities at operating conditions.

The AARTS combines specially designed hardware and powerful graphical user interface software to simplify accelerated life-testing on up to 96 RF units at one time. The device under test (DUT) can even differ in design and function, since the RF, DC, and thermal stimulus are independently controlled for each DUT

Each DUT fixture supports two independent bias control voltages, RF input and output connections, and temperature control. When measurements are completed on a DUT, it can be removed from the system and replaced with another unit without interrupting measurements on the other installed DUTs. Testing is performed under the control of the dedicated LifeTest software, which automates such complex operations as amplifier compression tests semiconductor parameter analyzer (SPA) tests, and DUT performance monitoring. Because all stimuli are computer controlled the software supports a flexible mode of test sequencing at user-defined intervals and test temperatures. For out-of-limit conditions, the system can notify operators locally or via email.