AARTS RF Systems
The RF Automated Accelerated Reliability Test Station (AARTS) systems are designed to stress devices with RF, DC, and thermal stimulus. The systems were designed from their inception to include RF stimulus - it was not added as an after-thought. Hence, the software and hardware are fully integrated and provide full-featured support. Each Device Under Test (DUT) has independent control of all three stimulus parameters. Since the computer measures all input and output power, and knows the surface temperature of the DUT, it can calculate the surface-to-channel temperature differential (either from a constant Θjc, or from a polynomial equation fitting ΔT to total power dissipation and device surface temperature).
The RF systems offer the following key features:
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Up to 36 channels in a 3-bay rack |
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High-frequency performance of fixtures that support a variety of standard RF package types (custom design are also available) |
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Individual control of each DUTs temperature allows software control of channel temperature without requiring constant power dissipation |
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Innovative fixture design that support Millimeter-Wave operation |
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High RF power capability (up to 20W per channel) |
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Range of DC power designs (60W to 400W) |
12-Channel RF AARTS System
Several fixture designs are available. The standard RF and Millimeter-Wave fixtures are shown below.
Both fixtures support pulsed and non-pulsed operation. The standard RF fixture employs SMA input/output connections, with a coplanar waveguide transition across the air-gap discontinuity. The mmW fixture is designed for very high-frequency operation. Waveguide input is converted to a planar (microstrip) waveguide inner area. This allows mounting of mmW MMICs or planar devices, while allowing lower loss transmission line routing of the mmW power.
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RF Fixture
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mmW Fixture
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