RF accelerated life testing can reveal a great deal about the reliability of compound semiconductor devices. Although this testing traditionally requires customized, sophisticated test instruments, there’s a better way..... Accel-RF’s fully integrated, automated, system characterizes RF and DC performance degradation to predict life expectancy.

Accel-RF Corporation^© is the only provider of fully integrated RF accelerated life-test/burn-in test systems for compound semiconductor devices which are used in the implementation of broadband wireless infrastructures and networks. Our fully automated turnkey systems determine RF and DC performance degradation with aging to predict life expectancy. Founded in June 2003, but with a legacy that goes back to 1988, Accel-RF Corporation is privately held and located in San Diego, California.

Accelerated life testing can reveal a great deal about the reliability of a semiconductor component. Today’s new wireless components are enabled by innovative compound semiconductors, i.e., GaAs, SiGe, GaN, SiC, InP and monolithic-microwave-integrated-circuit (MMIC) devices, capable of transmitting and receiving radio frequency (RF) signals. There is a growing demand and requirement to measure the life expectancy of these emerging devices by the manufacturers and customers of RF compound semiconductor products. Commercial applications are driven by five “9’s” (99.999%) reliability, higher quality, faster measurement, and standardized/consistent benchmark life test systems.

Currently, there is no turnkey system that can seamlessly life test and monitor for RF, DC, and elevated temperatures. Often, companies attempt to support testing by developing their own in-house configurations. This approach requires a high level of sophistication and customization, which can incur expensive capital outlays, lab space, expertise in three disciplines (RF, DC, Thermal), and long lead times to develop a test methodology/system and software. Handling devices through this non-integrated environment is prone to inaccuracies in data collection, is inflexible, and is not consistently repeatable.