Accel-RF’s latest white paper, “Recent History and Current Trends in GaN Reliability Testing”, is now available for download!

Paper Abstract:

Accel-RF President, Roland Shaw, outlines the recent history and current trends for reliability testing and quality assurance to keep up with the shift in GaN from “research novelty” to “market reality”.  This white paper will give a detailed overview in the development of GaN devices and MMICs from a reliability and burn-in test perspective.