Description

AARTS fully integrated, automated, turnkey system provides flexibility and accuracy in determining RF and DC performance degradation with aging to predict life expectancy for compound semiconductor devices. Our millimeter-wave Automated Accelerated Reliability Test Systems (AARTS) and fixture solutions are available in standard frequency ranges from 26.5 to 67 GHz.


Specs

  • RF Specifications
    • Independent RF drive level for each DUT
    • Standard frequency ranges to 67 GHz
    • Wide range of input drive levels with SSPA option
  • DC Specifications
    • Two independent bias sources for each DUT
    • Optional third bias supply for each DUT
    • Bias can be constant voltage or constant current sources
  • Temperature Specifications
    • Independent temperature control and monitoring for each DUT
    • Dynamically controlled baseplate temperature to maintain constant channel temperature
    • +50°C to +250°C DUT baseplate temperature range

Documentation

Product Datasheet Download