mm-Wave AARTS System
Description
The Automated Accelerated Reliability Test Station (AARTS) mmWave system can characterize the reliability of high frequency devices at their intended end-use operating conditions. In order to prove reliable operation at mmWave, industry experts agree that life testing should be performed at the intended frequency of operation. This new variant of the RF AARTS system incorporates some key features to overcome the challenges of testing at Ka-Band, V-Band, and beyond. This turnkey system can help demonstrate device reliability for the 5G market and other mmWave applications.
Key Features
Various channel capacities with independent controls and stimulus
Utilizes the Accel-RF Quantum SMART Fixture for maximum performance and flexibility in testing different package types or evaluation boards
Consistent and repeatable RF/DC interface to the Device Under Test over a wide temperature range
Range of DC bias supply options, from high resolution/low power supplies for small devices (GaAs HBT, SiGe) to 400W per channel for high power RF devices (GaN, LDMOS)
Supports integration of external characterization instruments, such as Semiconductor Parameter Analyzers
Documentation
