Accel-RF announces Quantum SMART bench-top semiconductor test system

SAN DIEGO– September 15, 2015— Accel-RF Instruments Corporation, the worldwide leader in turn-key reliability and performance characterization test systems for compound semiconductors, has “unplugged” the industry-leading RF SMART Fixture from their automated test platform and made it available for bench-top..

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Accel-RF® receives registered trademark status for both its name and logo

SAN DIEGO–September 11, 2015–Founded in 2003, Accel-RF® Instruments Corporation has become the worldwide leader in turn-key reliability and performance characterization test systems for compound semiconductors. Accel-RF systems have been used by research organizations and government laboratories in the global development..

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Accel-RF opens a permanent East Coast Office

SAN DIEGO–September 8, 2015—Accel-RF Instruments Corporation, the worldwide leader in turn-key Reliability and Performance Characterization Test Systems for Compound Semiconductors, announced today that it has opened a permanent office on the East Coast. This new location will be focused on..

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Accel-RF to showcase test systems at GOMACTech 2015

SAN DIEGO—March 17, 2015—Accel-RF Instruments Corporation, the worldwide leader in turn-key Reliability and Performance Characterization Test Systems for Compound Semiconductors, announces its participation in the upcoming GOMACTech 2015 Conference. GOMACTech will take place March 23 through 26 at the Union..

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Accel-RF to Exhibit at CSICS in La Jolla, CA

Accel-RF Instruments Corporation, the worldwide leader in turn-key Reliability and Performance Characterization Test Systems for Compound Semiconductors, announces its participation in the upcoming CSICS Exhibition in La Jolla, CA. The CSIC Symposium will take place October 19 through 22 at the Hyatt Regency La Jolla at Aventine.

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Accel-RF to Exhibit at ESREF in Berlin, Germany

Accel-RF Instruments Corporation, the worldwide leader in turn-key Reliability and Performance Characterization Test Systems for Compound Semiconductors, announces its participation in the upcoming ESREF Exhibition in Berlin, Germany. The ESREF conference will take place September 29 through October 2 at the Technische Universität Berlin (TUB).

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White Paper on Reliability Influencers in GaN SSPA Architectures Available for Download

Accel-RF’s latest white paper, “Assessing the Parameters that Influence Reliability in GaN-Based Solid-State Power Amplifier Architectures”, addresses the significant parameters that affect the reliability assessment of solid state power amplifiers utilizing GaN HEMT semiconductors. This tradeoff study contrasts three architectures of SSPA designs to demonstrate how a chosen topology may affect the mean time to failure of the resulting amplifier module.

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Accel-RF to Exhibit at CS MANTECH in Denver

Accel-RF Instruments Corporation announces its participation in the upcoming CS MANTECH Exhibition in Denver, CO. The MANTECH conference will take place May 19 through 22 at the Downtown Denver Sheraton. At the show, Accel-RF will announce its new Power Switching Dynamic Test System for device reliability and performance characterization.

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White Paper on GaN Reliability Testing Available for Download

Accel-RF’s latest white paper, “Recent History and Current Trends in GaN Reliability Testing”, outlines the recent history and current trends for reliability testing and quality assurance to keep up with the shift in GaN from “research novelty” to “market reality”. This white paper will give a detailed overview in the development of GaN devices and MMICs from a reliability and burn-in test perspective.

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Accel-RF Announces New RF-Biased Burn-In Test System

Accel-RF Instruments Corporation, the world-leader in supplying equipment for performing measured long-term reliability assessment on compound-semiconductors, announces the expansion of its RFBL measurement equipment with the introduction of an 80-Channel RF Bias Burn-In System.

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