SAN DIEGO—October 17, 2014—Accel-RF Instruments Corporation, the worldwide leader in turn-key Reliability and Performance Characterization Test Systems for Compound Semiconductors, announces its participation in the upcoming CSICS Exhibition in La Jolla, CA. The CSIC Symposium will take place October 19 through 22 at the Hyatt Regency La Jolla at Aventine.
At the show, Accel-RF will showcase its Automated Multi-Channel RF-Biased Burn-in Test System for accelerated-aging and parametric testing of RF semiconductor devices, as well as its Test Characterization Docking Station that is plug-and-play compatible with a family of test fixtures, including fixtures for CMOS mixed-signal characterization testing. The system architecture for these products is derived from the highly developed and field-proven measurement platform product, AARTS. Accel-RF has supplied AARTS equipment to top-tier manufactures worldwide for over 12 years.
“Accel-RF has a long history of exhibiting at the CSIC Symposium and this technical gathering is an exceptional venue for demonstrating our RF test equipment,” explains Roland Shaw, president of Accel-RF. “We are very excited to announce our 96-channel automated system for RF CMOS mixed-signal device performance characterization during the symposium,” concludes Shaw.
Updates and specific activities planned during CSICS will be posted on the AccelRF.com website as additional information becomes available.
Accel-RF Instruments Corporation specializes in the development, design, and production of accelerated life-test/burn-in test systems for semiconductor devices. These systems are turn-key integrated instruments that provide a cost-effective and high-value proposition for measuring intrinsic reliability, process-control validation, specification standard-deviation characterization, and product qualification testing.